The Opentrons Flex HEPA/UV Module enables you to run sensitive contamination-prone applications. It removes 99.99% of 0.3 μm DNA-containing particulates and biological contaminants like bacteria, fungi, and other microorganisms from the air, creating a clean work environment inside the Opentrons Flex.
The Opentrons Flex HEPA/UV Module enables you to run sensitive contamination-prone applications. It removes 99.99% of 0.3 μm DNA-containing particulates and biological contaminants like bacteria, fungi, and other microorganisms from the air, creating a clean work environment inside the Opentrons Flex.
029010 Gram Stain
Usage:For Gram Stain Test.
Specification: 10ml*4 vials
10ml*4vials
K-SDAM
SKU: 700004338
200 assays per kit
| Content: | 200 assays per kit |
| Shipping Temperature: | Ambient |
| Storage Temperature: | Short term stability: 2-8oC, Long term stability: See individual component labels |
| Stability: | > 1 year under recommended storage conditions |
| Analyte: | Starch Damage |
| Assay Format: | Spectrophotometer |
| Detection Method: | Absorbance |
| Wavelength (nm): | 510 |
| Signal Response: | Increase |
| Limit of Detection: | 0.5 g/100 g |
| Total Assay Time: | ~ 40 min |
| Application examples: | Cereal flours and other materials. |
| Method recognition: | AACC Method 76-31.01, ICC Standard No. 164 and RACI Standard Method |
The Starch Damage Test Kit is suitable for the determination of starch damage in wheat flour / cereal flours.
The milling of wheat causes physical damage to a proportion of the starch granules of the flour. The level of starch damage directly affects water absorption and dough mixing properties of the flour and is thus of technological significance.
See more of our starch assay kits.
Advantages
The Starch Damage Test Kit is suitable for the determination of starch damage in wheat flour / cereal flours.
